Detail publikačního výsledku

Fiber tips for reflection scanning near-field optical microscopy

TOMÁNEK, P.

Originální název

Fiber tips for reflection scanning near-field optical microscopy

Anglický název

Fiber tips for reflection scanning near-field optical microscopy

Druh

Kapitola, resp. kapitoly v odborné knize

Originální abstrakt

Nanometer size tips of fiber probes for reflection scanning near-field optical microscopy were fabricated by selective chemical etching of telecommunication optical fibers. The manufacturing of reproducible probes was controlled by varying different etching parameters.

Anglický abstrakt

Nanometer size tips of fiber probes for reflection scanning near-field optical microscopy were fabricated by selective chemical etching of telecommunication optical fibers. The manufacturing of reproducible probes was controlled by varying different etching parameters.

Klíčová slova

fiber probe, scanning near-field optical microscope, manufacturing, etching process,

Klíčová slova v angličtině

fiber probe, scanning near-field optical microscope, manufacturing, etching process,

Autoři

TOMÁNEK, P.

Vydáno

15.03.1993

Nakladatel

Kluwer Academic Publishers

Místo

Dordrecht

ISBN

0-7923-2394-7

Kniha

Near field optics

Edice

NATO ASI Series: E Applied sciences, vol. 242

Strany od

295

Strany do

302

Strany počet

8

BibTex

@inbook{BUT54895,
  author="Pavel {Tománek}",
  title="Fiber tips for reflection scanning near-field optical microscopy",
  booktitle="Near field optics",
  year="1993",
  publisher="Kluwer Academic Publishers",
  address="Dordrecht",
  series="NATO ASI Series: E Applied sciences, vol. 242",
  pages="295--302",
  isbn="0-7923-2394-7"
}