Detail publikačního výsledku

Process Characterization and Description in Order to Reliability Assessment

NOVOTNÝ, R.

Originální název

Process Characterization and Description in Order to Reliability Assessment

Anglický název

Process Characterization and Description in Order to Reliability Assessment

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Anglický abstrakt

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Klíčová slova

analysis, variation, quantification, experiment, optimization, factor, response, design

Klíčová slova v angličtině

analysis, variation, quantification, experiment, optimization, factor, response, design

Autoři

NOVOTNÝ, R.

Rok RIV

2010

Vydáno

01.01.2008

Nakladatel

Naun.org

ISSN

1998-4464

Periodikum

International Journal of Circuits Systems and Signal Processing

Svazek

2007

Číslo

4

Stát

Spojené státy americké

Strany od

303

Strany do

309

Strany počet

7

BibTex

@article{BUT49207,
  author="Radovan {Novotný}",
  title="Process Characterization and Description in Order to Reliability Assessment",
  journal="International Journal of Circuits Systems and Signal Processing",
  year="2008",
  volume="2007",
  number="4",
  pages="303--309",
  issn="1998-4464"
}