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Detail publikačního výsledku
VEČEŘA, I., VRBA, R., ŠVÉDA, M.
Originální název
A/D Switched-Current Converter with Built-In Self Testing Features
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.
Anglický abstrakt
Klíčová slova v angličtině
Autoři
Vydáno
01.01.2002
Nakladatel
SCI
Místo
Orlando
Kniha
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics SCI 2002
Strany od
250
Strany počet
4
BibTex
@inproceedings{BUT4657, author="Ivo {Večeřa} and Radimír {Vrba} and Miroslav {Švéda}", title="A/D Switched-Current Converter with Built-In Self Testing Features", booktitle="Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics SCI 2002", year="2002", pages="4", publisher="SCI", address="Orlando" }