Detail publikace

Near-field scanning optical microscope probe analysis

KLAPETEK, P. BURŠÍK, J. MARTINEK, J.

Originální název

Near-field scanning optical microscope probe analysis

Anglický název

Near-field scanning optical microscope probe analysis

Jazyk

en

Originální abstrakt

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.

Anglický abstrakt

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.

Dokumenty

BibTex 


@article{BUT44372,
  author="Petr {Klapetek} and Jiří {Buršík} and Jan {Martinek}",
  title="Near-field scanning optical microscope probe analysis",
  annote="In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.  
",
  chapter="44372",
  journal="Ultramicroscopy",
  number="1",
  volume="2007",
  year="2007",
  month="november",
  pages="1--1",
  type="journal article - other"
}