Detail publikace

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s

PAZDERA, L.

Originální název

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s

Anglický název

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s

Jazyk

en

Originální abstrakt

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s

Anglický abstrakt

Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s

Dokumenty

BibTex 


@article{BUT41385,
  author="Luboš {Pazdera}",
  title="Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s",
  annote="Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET´s",
  chapter="41385",
  journal="Electron device letters",
  number="5",
  volume="1997",
  year="1997",
  month="january",
  pages="480",
  type="journal article - other"
}