Detail publikace

Noise and scanning by local illumination as reliability estimation for silicon solar cells

CHOBOLA, Z., IBRAHIM, A.

Originální název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Anglický název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Jazyk

en

Originální abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Anglický abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Dokumenty

BibTex 


@article{BUT40583,
  author="Zdeněk {Chobola} and Ali {Ibrahim}",
  title="Noise and scanning by local illumination as reliability estimation for silicon solar cells",
  annote="This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.",
  chapter="40583",
  journal="Fluctuation and Noise Letters",
  number="1",
  volume="1",
  year="2001",
  month="march",
  pages="L21",
  type="journal article - other"
}