Detail publikačního výsledku

Noise and scanning by local illumination as reliability estimation for silicon solar cells

CHOBOLA, Z., IBRAHIM, A.

Originální název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Anglický název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Anglický abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Klíčová slova v angličtině

Solar cells, noise, homogeneity, reliability

Autoři

CHOBOLA, Z., IBRAHIM, A.

Vydáno

16.03.2001

ISSN

0219-4775

Periodikum

FLUCTUATION AND NOISE LETTERS

Svazek

1

Číslo

1

Stát

Singapurská republika

Strany od

L21

Strany počet

6