Detail publikačního výsledku

Thickness measurement of thin dielectric films by evanescent total reflection fluorescence

BENEŠOVÁ, M.; TOMÁNEK, P.

Originální název

Thickness measurement of thin dielectric films by evanescent total reflection fluorescence

Anglický název

Thickness measurement of thin dielectric films by evanescent total reflection fluorescence

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The electric filed of an evanescent wave generates fluorescence in the interface between dielectric surface and the adjacent, fluorescing, medium of lower refractive index. The difference between the fluorescing signals from covered and noncovered area are compared.

Anglický abstrakt

The electric filed of an evanescent wave generates fluorescence in the interface between dielectric surface and the adjacent, fluorescing, medium of lower refractive index. The difference between the fluorescing signals from covered and noncovered area are compared.

Klíčová slova

thin film, dielectric, fluorescence, attenuation

Klíčová slova v angličtině

thin film, dielectric, fluorescence, attenuation

Autoři

BENEŠOVÁ, M.; TOMÁNEK, P.

Vydáno

21.10.1999

Nakladatel

Blackwell Science

Místo

Oxford, UK

ISSN

0022-2720

Periodikum

JOURNAL OF MICROSCOPY

Svazek

194

Číslo

2/3

Stát

Spojené království Velké Británie a Severního Irska

Strany od

434

Strany do

438

Strany počet

5

BibTex

@article{BUT37583,
  author="Markéta {Benešová} and Pavel {Tománek}",
  title="Thickness measurement of thin dielectric films by evanescent total reflection fluorescence",
  journal="JOURNAL OF MICROSCOPY",
  year="1999",
  volume="194",
  number="2/3",
  pages="434--438",
  issn="0022-2720"
}