Detail publikačního výsledku

Measurement induced solar cell defect characterization

ŠKARVADA, P.

Originální název

Measurement induced solar cell defect characterization

Anglický název

Measurement induced solar cell defect characterization

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Light emission from reverse biased solar cell can reveal structure inhomogenity. Although there is large variety of defects, this paper shows simple method for their basic classification. The method allows to determine imperfections caused by mechanical damage of sample (mi-crocracks and structure snapping). It is based on the measurement of light emission at fixed reverse voltage while the temperature is changing in the range of 20 K. Experimental light emission results are consequently correlated with light induced beam current map.

Anglický abstrakt

Light emission from reverse biased solar cell can reveal structure inhomogenity. Although there is large variety of defects, this paper shows simple method for their basic classification. The method allows to determine imperfections caused by mechanical damage of sample (mi-crocracks and structure snapping). It is based on the measurement of light emission at fixed reverse voltage while the temperature is changing in the range of 20 K. Experimental light emission results are consequently correlated with light induced beam current map.

Klíčová slova

solar cell, nondestructive testing, imperfections

Klíčová slova v angličtině

solar cell, nondestructive testing, imperfections

Autoři

ŠKARVADA, P.

Rok RIV

2012

Vydáno

29.04.2011

Nakladatel

Novpress

Místo

Brno

ISBN

978-80-214-4273-3

Kniha

proceedings of the 17th conference student eeict 2011 vol. 3

Strany od

386

Strany do

390

Strany počet

5

BibTex

@inproceedings{BUT36027,
  author="Pavel {Škarvada}",
  title="Measurement induced solar cell defect characterization",
  booktitle="proceedings of the 17th conference student eeict 2011 vol. 3",
  year="2011",
  number="1",
  pages="386--390",
  publisher="Novpress",
  address="Brno",
  isbn="978-80-214-4273-3"
}