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NICÁK, M.; ŠVECOVÁ, O.; ŠANDERA, J.; PULEC, J.; SZENDIUCH, I.
Originální název
Reliability and Simulation of Lead-Free Solder Joint Behavior in 3D Packaging Structure
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
This paper deals with behavior of lead-free solder joint applied in 3D electronic packaging structure. There are plenty of factors which influences reliability and life-time of solder compound connection. Type of substrates, selection of materials and process arrangement are the main areas to investigate. The content consists from three main parts. The first deals with introduction of designed test pattern, material, and process arrangement and applied testing methods. Second part continues with ANSYS software simulation of solder interconnections during thermo-mechanical stress tests and third part is aimed to experimental evaluation of results in the comparison to simulated results.
Anglický abstrakt
Klíčová slova
3D Packaging, ANSYS, Lead-free, Reliability, Solder joint
Klíčová slova v angličtině
Autoři
Rok RIV
2011
Vydáno
12.01.2011
Nakladatel
Trans Tech Publications
Místo
Švýcarsko
ISBN
978-3-03785-006-0
Kniha
Key Engineering Materials Vol. 465 (2011)
ISSN
1013-9826
Periodikum
Key Engineering Materials (print)
Svazek
465
Číslo
491
Stát
Švýcarská konfederace
Strany od
Strany do
494
Strany počet
4
URL
http://www.scientific.net/KEM.465.491
BibTex
@inproceedings{BUT36015, author="Michal {Nicák} and Olga {Švecová} and Josef {Šandera} and Jiří {Pulec} and Ivan {Szendiuch}", title="Reliability and Simulation of Lead-Free Solder Joint Behavior in 3D Packaging Structure", booktitle="Key Engineering Materials Vol. 465 (2011)", year="2011", journal="Key Engineering Materials (print)", volume="465", number="491", pages="491--494", publisher="Trans Tech Publications", address="Švýcarsko", isbn="978-3-03785-006-0", issn="1013-9826", url="http://www.scientific.net/KEM.465.491" }