Detail publikačního výsledku

Evolvable Hardware System at Extreme Low Temperatures

ZEBULUM, R.; STOICA, A.; KEYMEULEN, D.; SEKANINA, L.

Originální název

Evolvable Hardware System at Extreme Low Temperatures

Anglický název

Evolvable Hardware System at Extreme Low Temperatures

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

This paper describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment (EE). In addition to hardening-by-process and hardening by-design, "hardening-by-reconfiguration", when applicable, could be used tomitigate drifts, degradation, or damage on electronic devices (chips) in EE, by using re-configurable devices and an adaptive selfreconfiguration of their circuit topology. Conventional circuit design exploits device characteristics within a certain temperature/radiation range; when that is exceeded, the circuit function degrades. On a reconfigurable device, although component parameters change in EE, a new circuit design, suitable for new parameter values, may be mapped into the reconfigurable structure to recover the initial circuit function. This paper demonstrates this technique for circuit evolution and recovery at liquid nitrogen temperatures (-196.6 °C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at extreme low temperatures.

Anglický abstrakt

This paper describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment (EE). In addition to hardening-by-process and hardening by-design, "hardening-by-reconfiguration", when applicable, could be used tomitigate drifts, degradation, or damage on electronic devices (chips) in EE, by using re-configurable devices and an adaptive selfreconfiguration of their circuit topology. Conventional circuit design exploits device characteristics within a certain temperature/radiation range; when that is exceeded, the circuit function degrades. On a reconfigurable device, although component parameters change in EE, a new circuit design, suitable for new parameter values, may be mapped into the reconfigurable structure to recover the initial circuit function. This paper demonstrates this technique for circuit evolution and recovery at liquid nitrogen temperatures (-196.6 °C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at extreme low temperatures.

Klíčová slova

evolvable hardware, extreme low temperatures, functional recovery

Klíčová slova v angličtině

evolvable hardware, extreme low temperatures, functional recovery

Autoři

ZEBULUM, R.; STOICA, A.; KEYMEULEN, D.; SEKANINA, L.

Rok RIV

2010

Vydáno

19.09.2005

Nakladatel

Springer Verlag

Místo

Berlin

ISBN

978-3-540-28736-0

Kniha

Evolvable Systems: From Biology to Hardware

Edice

Lecture Notes in Computer Science

Svazek

3637

Strany od

37

Strany do

45

Strany počet

9

URL

http://www.fit.vutbr.cz/~sekanina/publ/ices05/lowtemp.pdf

BibTex

@inproceedings{BUT33688,
  author="Ricardo {Zebulum} and Adrian {Stoica} and Didier {Keymeulen} and Lukáš {Sekanina}",
  title="Evolvable Hardware System at Extreme Low Temperatures",
  booktitle="Evolvable Systems: From Biology to Hardware",
  year="2005",
  series="Lecture Notes in Computer Science",
  volume="3637",
  pages="37--45",
  publisher="Springer Verlag",
  address="Berlin",
  isbn="978-3-540-28736-0",
  url="http://www.fit.vutbr.cz/~sekanina/publ/ices05/lowtemp.pdf"
}