Detail publikačního výsledku

Nonlinear On-chip Capacitor Characterization

SUTORÝ, T.; KOLKA, Z.; BIOLEK, D.; BIOLKOVÁ, V.

Originální název

Nonlinear On-chip Capacitor Characterization

Anglický název

Nonlinear On-chip Capacitor Characterization

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.

Anglický abstrakt

The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.

Klíčová slova

CBCM, testing, MOSCAP

Klíčová slova v angličtině

CBCM, testing, MOSCAP

Autoři

SUTORÝ, T.; KOLKA, Z.; BIOLEK, D.; BIOLKOVÁ, V.

Rok RIV

2010

Vydáno

01.09.2007

Nakladatel

IEEE

Místo

Sevilla, Spain

ISBN

978-1-4244-1341-6

Kniha

Proceedings of the 18th European Conference on Circuit Theory and Design ECCTD'07

Strany od

220

Strany do

223

Strany počet

4

BibTex

@inproceedings{BUT23792,
  author="Tomáš {Sutorý} and Zdeněk {Kolka} and Dalibor {Biolek} and Viera {Biolková}",
  title="Nonlinear On-chip Capacitor Characterization",
  booktitle="Proceedings of the 18th European Conference on Circuit Theory and Design ECCTD'07",
  year="2007",
  pages="220--223",
  publisher="IEEE",
  address="Sevilla, Spain",
  isbn="978-1-4244-1341-6"
}