Detail publikačního výsledku

Defect-Aware Approach to Validation of MEMS Microphones in Spherical Arrays

Originální název

Defect-Aware Approach to Validation of MEMS Microphones in Spherical Arrays

Anglický název

Defect-Aware Approach to Validation of MEMS Microphones in Spherical Arrays

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

This paper presents defect-aware method for the systematic validation of MEMS-based spherical microphone arrays. Addressing the inherent discrepancies between idealized spatial models and physical hardware realizations, we propose a diagnostic framework designed to mitigate manufacturing stochasticity and electromechanical tolerances. The method employs a reference-calibrated and compensated technique, where each array element is normalized against a high-precision microphone to eliminate spectral bias from the measurement chain. An automated analytical pipeline evaluates these compensated responses to identify non-conforming units across critical spectral regions. By benchmarking individual microphone performance against an aggregate array-relative reference, the system isolates anomalies such as acoustic port occlusions, mechanical placement and sensitivity change. This approach facilitates precise sensitivity matching and provides a deterministic criterion for finding defective microphones, ensuring high precision in direction of acoustic axis and spatial sampling stability for advanced sound field analysis.

Anglický abstrakt

This paper presents defect-aware method for the systematic validation of MEMS-based spherical microphone arrays. Addressing the inherent discrepancies between idealized spatial models and physical hardware realizations, we propose a diagnostic framework designed to mitigate manufacturing stochasticity and electromechanical tolerances. The method employs a reference-calibrated and compensated technique, where each array element is normalized against a high-precision microphone to eliminate spectral bias from the measurement chain. An automated analytical pipeline evaluates these compensated responses to identify non-conforming units across critical spectral regions. By benchmarking individual microphone performance against an aggregate array-relative reference, the system isolates anomalies such as acoustic port occlusions, mechanical placement and sensitivity change. This approach facilitates precise sensitivity matching and provides a deterministic criterion for finding defective microphones, ensuring high precision in direction of acoustic axis and spatial sampling stability for advanced sound field analysis.

Klíčová slova

defect detection, spherical microphone array, MEMS microphone arrays, manufacturing tolerances, anechoic measurement

Klíčová slova v angličtině

defect detection, spherical microphone array, MEMS microphone arrays, manufacturing tolerances, anechoic measurement

Vydáno

28.04.2026

Nakladatel

BRNO UNIVERSITY OF TECHNOLOGY, FACULTY OF ELECTRICAL ENGINEERING AND COMMUNICATION

Místo

Brno

ISBN

978-80-214-6418-6

Periodikum

Proceedings II of the Conference STUDENT EEICT

Stát

Česká republika

Strany od

167

Strany do

171

Strany počet

5

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2026_sbornik_2.pdf

BibTex

@inproceedings{BUT211700,
  author="Matej {Liska}",
  title="Defect-Aware Approach to Validation of MEMS Microphones in
Spherical Arrays",
  year="2026",
  journal="Proceedings II of the Conference STUDENT EEICT",
  pages="167--171",
  publisher="BRNO UNIVERSITY OF TECHNOLOGY, FACULTY OF ELECTRICAL ENGINEERING AND COMMUNICATION",
  address="Brno",
  doi="10.13164/eeict.2026.167",
  isbn="978-80-214-6418-6",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2026_sbornik_2.pdf"
}