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Detail publikačního výsledku
SABADKOVÁ, T.; VALÚCHOVÁ, J.; MAJEROVÁ, M.; ŠVANCÁREK, P.; ŠVANČÁRKOVÁ, M.; ŠKRÁTEK, M.; DVUREČENSKIJ, A.; DRDLÍK, D.; PRNOVÁ, A.; GALUSEK, D.
Originální název
Preparation and Characterization of Magnetic HEO with the Composition (Al0.2Co0.2Cr0.2Ni0.2Fe0.2X0.2)3O4; X= Mg, Zn
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
A ceramic material consisting of two distinct compositions, (Al₀.₂Co₀.₂Cr₀.₂Ni₀.₂Fe₀.₂Zn₀.₂)₃O₄ and (Al₀.₂Co₀.₂Cr₀.₂Ni₀.₂Fe₀.₂Mg₀.₂)₃O₄, was synthesized using solid-state synthesis of the powder, followed by cold pressing and cold isostatic pressing. Pressed green bodies were sintered at two different temperatures (1223 K and 1423 K). The study examined the effects of composition and sintering temperature on the structural and magnetic properties of the materials, utilizing X-ray diffraction (XRD) analysis and SQUID magnetometry. High-entropy oxide samples with a single-phase spinel structure (space group Fd-3m) were prepared. Analysis of the magnetic properties revealed that the samples exhibited soft magnetic characteristics, indicating potential applications in the development of reversible magneto-active composites, such as magnetorheological elastomers.
Anglický abstrakt
Klíčová slova
High-Entropy Oxide; Magnetic Properties; Sintering
Klíčová slova v angličtině
Autoři
Rok RIV
2026
Vydáno
03.12.2025
Nakladatel
IEEE
Místo
45 E 47TH ST, NEW YORK, NY 10017 USA
ISBN
979-8-3315-5712-6
Kniha
2025 15TH INTERNATIONAL CONFERENCE ON MEASUREMENT
Strany od
159
Strany do
162
Strany počet
4
URL
https://ieeexplore.ieee.org/document/11078712
BibTex
@inproceedings{BUT201586, author="Terezia {Sabadková} and Jana {Valúchová} and Melinda {Majerová} and Peter {Švancárek} and Mariana {Švančárková} and Martin {Škrátek} and {} and Daniel {Drdlík} and Anna {Prnová} and Dušan {Galusek}", title="Preparation and Characterization of Magnetic HEO with the Composition (Al0.2Co0.2Cr0.2Ni0.2Fe0.2X0.2)3O4; X= Mg, Zn", booktitle="2025 15TH INTERNATIONAL CONFERENCE ON MEASUREMENT", year="2025", pages="4", publisher="IEEE", address="45 E 47TH ST, NEW YORK, NY 10017 USA", doi="10.23919/MEASUREMENT66999.2025.11078712", isbn="979-8-3315-5712-6", url="https://ieeexplore.ieee.org/document/11078712" }