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Detail publikačního výsledku
LA, Q.; VINTR, Z.; ŽÁK, L.; VALIŠ, D.; KOHL, Z.
Originální název
Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability
Anglický název
Druh
Článek Scopus
Originální abstrakt
The high-power Light Emitting Diode (LED) is a specialized type of LED that has found extensive use in a wide array of fields, particularly in areas such as lighting, signalling, and medical applications due to their cost-effectiveness and replace-ability. As a result of significant technological advancements, high-power LEDs have undergone rapid development, leading to improvements in quality, variety, and application. Within the realm of reliability research, high-power LEDs have garnered considerable attention. The primary aim of this paper is to conduct a comprehensive exploration and analysis of the existing methodologies for testing the reliability of high-power LEDs. This endeavour will involve a thorough investigation into the types of objects utilized for testing, the diverse testing methods employed, the techniques for data collection, and the parameters measured during testing. Furthermore, the paper aims to delve into the potential application of machine learning techniques for modelling, estimating, and predicting the reliability of high-power LEDs. The anticipated outcomes of this paper are intended to establish the foundation for the adoption of innovative approaches in reliability testing and to enhance the prediction and estimation of high-power LEDs reliability.
Anglický abstrakt
Klíčová slova
data management; estimation method; innovation; machine learning; testing method
Klíčová slova v angličtině
Autoři
Vydáno
01.01.2025
Nakladatel
Entomological Society of America
Periodikum
Annals of the Entomological Society of America
Číslo
413
Stát
Spojené království Velké Británie a Severního Irska
Strany od
333
Strany do
338
Strany počet
6
URL
https://doi.org/10.1051/matecconf/202541303005
BibTex
@article{BUT201476, author="{} and {} and Libor {Žák} and {} and {}", title="Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability", journal="Annals of the Entomological Society of America", year="2025", number="413", pages="6", doi="10.1051/matecconf/202541303005", issn="0013-8746", url="https://doi.org/10.1051/matecconf/202541303005" }