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PANGHAL, A.; KUMAR, Y.; MUKHERJEE, S.; KATOVSKÝ, K.; SINGH, N.; SINGH, S.; DHAWAN, G.
Originální název
Investigation of Swift Heavy Ion Irradiation on Gd2Zr2O7 Pyrochlore
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Complex oxides offer distinct advantages for immobilizing radioactive waste. Here, we delve into the deviations in the structure of Gd2Zr2O7 (GZO) ceramics against the irradiation of iodine ions having 100 MeV energy. X-ray diffraction (XRD) and Raman spectroscopy have been exercised to observe the structural changes. XRD analysis reveals that with increasing ion fluence, the suppression or disappearance of superstructure reflections occurs, indicating a pyrochlore to defect fluorite structure transformation. Raman spectra further confirm the change in vibrational mode in GZO, which strongly rely degree of disorder as fluence is enhanced. XRD and Raman techniques provide consistent insights into the structural changes induced by swift heavy ion irradiation (100 MeV I7+). Notably, no amorphization has been observed, highlighting the robustness of Gd2Zr2O7 ceramics for potential nuclear applications in extreme environments.
Anglický abstrakt
Klíčová slova
Pyrochlore; Structural changes; Nuclear Waste; Ceramics
Klíčová slova v angličtině
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Rok RIV
2026
Vydáno
01.01.2025
Nakladatel
IEEE
Místo
NEW YORK
ISBN
979-8-3315-8637-9
Kniha
International Scientific Conference on Electric Power Engineering
Periodikum
Proceedings of the ... International Scientific Conference on Electric Power Engineering
Stát
Spojené státy americké
Strany od
139
Strany do
142
Strany počet
4
BibTex
@inproceedings{BUT201302, author="{} and {} and Surjit {Mukherjee} and Karel {Katovský} and {} and {} and {}", title="Investigation of Swift Heavy Ion Irradiation on Gd2Zr2O7 Pyrochlore", booktitle="International Scientific Conference on Electric Power Engineering", year="2025", journal="Proceedings of the ... International Scientific Conference on Electric Power Engineering", pages="139--142", publisher="IEEE", address="NEW YORK", doi="10.1109/EPE67256.2025.11127156", isbn="979-8-3315-8637-9", issn="2376-5623" }