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Detail publikačního výsledku
BLUMENSTEIN, J.; ZÁVORKA, R.; VYCHODIL, J.; MIKULÁŠEK, T.; WOJTUŃ, J.; KELNER, J.; ZIÓŁKOWSKI, C.; SHUKLA, R.; HOFER, M.; ZEMEN, T.; MECKLENBRÄUKER, C.; CHANDRA, A.; PROKEŠ, A.
Originální název
Angularly-resolved 3D foliage modeling and measurements at 60 and 80 GHz: From stochastic geometry to deterministic channel characterization
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
n this paper, we show a stochastic approach to generate a 3D model of a foliage, which is then used for deterministic ray-tracing channel modeling. This approach is verified by a measurement campaign at 60 and 80 GHz with 2 GHz bandwidth. The wireless channel is characterized by path-loss and RMS delay spread and we show the angular dependency of those parameters when the receiver is placed on a half-circle around the tree. Besides electromagnetic material properties, the 3D model is characterized by several interpretable parameters, including tree volume, leaf size, leaf density, and the tree crown shape parameter.
Anglický abstrakt
Klíčová slova
Wireless communication;Solid modeling;Three-dimensional displays;Trees (botanical);Millimeter wave technology;Stochastic processes;Receivers;Ray tracing;Delays;
Klíčová slova v angličtině
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Vydáno
02.01.2026
Nakladatel
IEEE
Místo
Bangalore, India
ISBN
979-8-3315-9193-9
Kniha
IEEE Future Networks World Forum
Strany od
1
Strany do
6
Strany počet
URL
https://ieeexplore.ieee.org/abstract/document/11317573
BibTex
@inproceedings{BUT201258, author="Jiří {Blumenstein} and Radek {Závorka} and Josef {Vychodil} and Tomáš {Mikulášek} and Jarosław {Wojtuń} and Jan M. {Kelner} and Cezary {Ziółkowski} and Rajeev {Shukla} and Markus {Hofer} and Thomas {Zemen} and Christoph {Mecklenbräuker} and Aniruddha {Chandra} and Aleš {Prokeš}", title="Angularly-resolved 3D foliage modeling and measurements at 60 and 80 GHz: From stochastic geometry to deterministic channel characterization", booktitle="IEEE Future Networks World Forum", year="2026", pages="6", publisher="IEEE", address="Bangalore, India", doi="10.1109/FNWF66845.2025.11317573", isbn="979-8-3315-9193-9", url="https://ieeexplore.ieee.org/abstract/document/11317573" }