Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikačního výsledku
MEZINA, A.; BURGET, R.; KOTRLY, M.
Originální název
Defect Detection in Battery Cells Using U-Net-Based Neural Networks
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Battery technologies are widely used in various applications, including smartphones, wearable devices, laptops, and mobile phones. In this study, we propose a methodology specifically designed for segmenting defects in 2D CT slices of battery cells. This methodology involves the creation of datasets aimed at defect detection, along with benchmarking several U-Net-based models on these datasets. Our results indicate that the U-Net+Xception model achieves the highest binary accuracy of 0.9982 and an Intersection over Union (IoU) score of 0.8066, demonstrating its strong capability to differentiate between background and foreground regions. In summary, this work establishes a valuable baseline for CT-based defect detection in battery cells, showcasing the benefits of combining U-Net architectures with advanced pre-trained encoders. This research contributes to the development of scalable and automated inspection tools that can be integrated into battery manufacturing and diagnostic processes.
Anglický abstrakt
Klíčová slova
deep learning; battery cells; defect detection; segmentation; computed tomography
Klíčová slova v angličtině
Autoři
Rok RIV
2026
Vydáno
03.11.2025
Nakladatel
IEEE
Místo
Italy
ISBN
979-8-3315-7675-2
Kniha
2025 17th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT)
Strany od
164
Strany do
169
Strany počet
6
BibTex
@inproceedings{BUT199898, author="{} and Anzhelika {Mezina} and Radim {Burget} and {}", title="Defect Detection in Battery Cells Using U-Net-Based Neural Networks", booktitle="2025 17th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT)", year="2025", pages="164--169", publisher="IEEE", address="Italy", doi="10.1109/icumt67815.2025.11268718", isbn="979-8-3315-7675-2" }