Detail publikačního výsledku

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

VANĚK, J., CHOBOLA, Z.

Originální název

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

Anglický název

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

Anglický abstrakt

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

Klíčová slova v angličtině

Noise,Laser diodes, GaSb

Autoři

VANĚK, J., CHOBOLA, Z.

Vydáno

14.05.2006

Nakladatel

Elekctron Devices Society

Místo

Belgrade, Serbia and Montenegro

ISBN

1-4244-0116-X

Kniha

25th International conference on Microelectronics

Strany od

307

Strany počet

2

BibTex

@inproceedings{BUT19984,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes",
  booktitle="25th International conference on Microelectronics",
  year="2006",
  pages="2",
  publisher="Elekctron Devices Society",
  address="Belgrade, Serbia and Montenegro",
  isbn="1-4244-0116-X"
}