Detail publikace

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

VANĚK, J., CHOBOLA, Z.

Originální název

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

Anglický název

Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes

Jazyk

en

Originální abstrakt

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

Anglický abstrakt

Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.

Dokumenty

BibTex 


@inproceedings{BUT19984,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes",
  annote="Transport and noise characteristic of forward biased 2.3 um CW GaSb laser diodes were measured in order to evaluate new technology.",
  address="Elekctron Devices Society",
  booktitle="25th International conference on Microelectronics",
  chapter="19984",
  institution="Elekctron Devices Society",
  year="2006",
  month="may",
  pages="307",
  publisher="Elekctron Devices Society",
  type="conference paper"
}