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Detail publikačního výsledku
František Martínek Vilém Neděla Vladimír Tichý Adam Antálek
Originální název
A New Tool for Numerical Analysis of Signal Creation Processes in ESEM/A-ESEM
Anglický název
Druh
Článek WoS
Originální abstrakt
A new tool for the simulation of electron-gas-sample interaction phenomena under real experimental conditions of elevated gas pressure in electron microscopes is introduced. It allows in-silico testing and optimization of detection systems of any given geometry, taking spatially variable electric field and gas flow into account. Its possibilities are demonstrated through a detailed analysis of a widely used environmental secondary detector variant (ESD-V) geometry, leading to a proposal and experimental proof of a significant increase in its secondary electron (SE) collection efficiency. In addition, suppression of the detected BSE signal, i.e., material contrast and edge effect, is demonstrated on the image of an embolized human benign tumor. The validity of the model is verified by comparison with experimental data of overall signal development in varying pressure.
Anglický abstrakt
Klíčová slova
Electrons, Detectors, Electric fields, Ionization, Geometry, Electrodes, Scanning electron microscopy, Electric potential, Trajectory, Libraries, Advanced environmental scanning electron microscopy (A-ESEM), electron microscopy, ionization detectors, Monte Carlo (MC) simulation, variable pressure scanning electron microscopy (VP-SEM), visualization
Klíčová slova v angličtině
Autoři
Rok RIV
2026
Vydáno
01.01.2025
Periodikum
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Číslo
74
Stát
Spojené státy americké
Strany do
10
Strany počet
URL
https://ieeexplore.ieee.org/document/11217191
BibTex
@article{BUT199587, author="František {Martínek} and Vilém {Neděla} and {} and Adam {Antálek}", title="A New Tool for Numerical Analysis of Signal Creation Processes in ESEM/A-ESEM", journal="IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT", year="2025", number="74", pages="10", doi="10.1109/TIM.2025.3625329", issn="0018-9456", url="https://ieeexplore.ieee.org/document/11217191" }