Detail publikačního výsledku

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

Originální název

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

Anglický název

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

A simple and efficacious modality of introducing causal excitations in CST Studio Suite (R) time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

Anglický abstrakt

A simple and efficacious modality of introducing causal excitations in CST Studio Suite (R) time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

Klíčová slova

electromagnetic theory, computational electromagnetics, time-domain analysis, electromagnetic pulses, slot antenna

Klíčová slova v angličtině

electromagnetic theory, computational electromagnetics, time-domain analysis, electromagnetic pulses, slot antenna

Autoři

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

Rok RIV

2025

Vydáno

31.10.2022

Nakladatel

IEEE

ISBN

978-2-8748-7069-9

Kniha

European Microwave Conference

Strany od

234

Strany do

237

Strany počet

4

URL

BibTex

@inproceedings{BUT196509,
  author="Junhong {Gu} and Roy {van Krieken} and Martin {Štumpf} and Ioan Ernest {Lager}",
  title="Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations",
  booktitle="European Microwave Conference",
  year="2022",
  pages="234--237",
  publisher="IEEE",
  isbn="978-2-8748-7069-9",
  url="https://ieeexplore.ieee.org/document/9924345"
}