Detail publikačního výsledku

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V.

Originální název

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Anglický název

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Druh

Konferenční sborník (ne stať)

Originální abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Anglický abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Klíčová slova

electronic circuit, design, test, design method, digital circuit, analog circuit

Klíčová slova v angličtině

electronic circuit, design, test, design method, digital circuit, analog circuit

Autoři

DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V.

Rok RIV

2025

Vydáno

14.05.2024

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Kliece

ISBN

979-8-3503-5934-3

Strany počet

155

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=10508803

BibTex

@proceedings{BUT188622,
  editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.",
  title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2024",
  pages="155",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Kliece",
  doi="10.1109/DDECS60919.2024",
  isbn="979-8-3503-5934-3",
  url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803"
}