Detail publikačního výsledku

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Nagy, Z., Kohoutek, M.

Originální název

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Anglický název

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper deals with diffraction pattern analysis for accurate 2d non-contact dimensional measurements.

Anglický abstrakt

The paper deals with diffraction pattern analysis for accurate 2d non-contact dimensional measurements.

Klíčová slova v angličtině

diffraction of light, subpixel analysis, dimensional measurement

Autoři

Nagy, Z., Kohoutek, M.

Vydáno

01.01.2005

Nakladatel

VIIP 2005

Místo

Benidorm

Kniha

Proceedins of the Int. Conf. Visualisation, Imaging and Image Processing 2005

Edice

edice

Svazek

rocnik

Strany od

1

Strany počet

6

BibTex

@inproceedings{BUT16656,
  author="Zoltán {Nagy} and Michal {Kohoutek}",
  title="DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS",
  booktitle="Proceedins of the Int. Conf. Visualisation, Imaging and Image Processing 2005",
  year="2005",
  series="edice",
  volume="rocnik",
  number="poradi",
  pages="6",
  publisher="VIIP 2005",
  address="Benidorm"
}