Detail publikace

Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells

CHOBOLA, Z.

Originální název

Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells

Anglický název

Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells

Jazyk

en

Dokumenty

BibTex 


@inproceedings{BUT1649,
  author="Zdeněk {Chobola}",
  title="Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells",
  address="Italian Society for Non-Destructvie Testing Monitoring Diagnostics",
  booktitle="15th World Conference of Non-Destructive Testing",
  chapter="1649",
  institution="Italian Society for Non-Destructvie Testing Monitoring Diagnostics",
  year="2000",
  month="october",
  pages="1--5",
  publisher="Italian Society for Non-Destructvie Testing Monitoring Diagnostics",
  type="conference paper"
}