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YACOOT, A.; KLAPETEK, P.; VALTR, M.; GROLICH, P.; DONGMO, H.; LAZZERINI, M.; BRIDGES, A.
Originální název
Design and performance of a test rig for evaluation of nanopositioning stages
Anglický název
Druh
Článek WoS
Originální abstrakt
Nanopositioning stages are used in many areas of nanotechnology and advanced materials analysis, often being integrated into analytical devices such as scanning probe and optical microscopes and manufacturing devices (e.g. lithographic systems). We present a metrological instrument, together with software, designed for traceable evaluation of stage performance. The system capabilities and performance are illustrated by measurement of stages of different levels of accuracy, including a low cost custom built stage manufactured by 3D printing. The traceability of the system is described and main uncertainty sources are discussed. Guidelines are given for the specification of stage performance.
Anglický abstrakt
Klíčová slova
multi-axis positioning stages; traceability; nanopositioning; dimensional metrology
Klíčová slova v angličtině
Autoři
Rok RIV
2020
Vydáno
07.02.2019
Nakladatel
IOP PUBLISHING LTD
Místo
BRISTOL
ISSN
1361-6501
Periodikum
Measurement Science and Technology
Svazek
30
Číslo
3
Stát
Spojené království Velké Británie a Severního Irska
Strany od
1
Strany do
10
Strany počet
URL
https://iopscience.iop.org/article/10.1088/1361-6501/aafd03
BibTex
@article{BUT160891, author="Andrew {Yacoot} and Petr {Klapetek} and Miroslav {Valtr} and Petr {Grolich} and Herve {Dongmo} and Mattia {Lazzerini} and Angus {Bridges}", title="Design and performance of a test rig for evaluation of nanopositioning stages", journal="Measurement Science and Technology", year="2019", volume="30", number="3", pages="1--10", doi="10.1088/1361-6501/aafd03", issn="0957-0233", url="https://iopscience.iop.org/article/10.1088/1361-6501/aafd03" }