Detail publikačního výsledku

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion

ŢĂLU, Ş.; YADAV, R.; ARMAN, A.; KORPI, A.; SOBOLA, D.; TALU, M.; REZAEE, S.; ACHOUR, A.; JUREČKA, S.; MARDANI, M.

Originální název

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion

Anglický název

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion

Druh

Článek WoS

Originální abstrakt

Fractal concepts are used to explore how different energies (10, 20 and 50 keV) and fluence of 5 × 1017 N+ cm−2 affect the morphology of nickel thin film. The nickel thin film with thickness of 100 nm is prepared by electron beam evaporation technique at room temperature on stainless steel (AISI 316) substrates. The nanoscale three-dimensional (3-D) surface micro-morphologies are investigated by atomic force microscopy (AFM). Interface width is used to describe the surface height fluctuations. The autocorrelation function with height-height correlation function give the quantitative data about the morphology of surface. The value of roughness exponent and fractal dimension is computed by height-height correlation function. Fractal measure is an important analysis which provides fundamental insights into the texture characteristics and a direct way of testing their functional role.

Anglický abstrakt

Fractal concepts are used to explore how different energies (10, 20 and 50 keV) and fluence of 5 × 1017 N+ cm−2 affect the morphology of nickel thin film. The nickel thin film with thickness of 100 nm is prepared by electron beam evaporation technique at room temperature on stainless steel (AISI 316) substrates. The nanoscale three-dimensional (3-D) surface micro-morphologies are investigated by atomic force microscopy (AFM). Interface width is used to describe the surface height fluctuations. The autocorrelation function with height-height correlation function give the quantitative data about the morphology of surface. The value of roughness exponent and fractal dimension is computed by height-height correlation function. Fractal measure is an important analysis which provides fundamental insights into the texture characteristics and a direct way of testing their functional role.

Klíčová slova

AFM, fratctal analysis, topography

Klíčová slova v angličtině

AFM, fratctal analysis, topography

Autoři

ŢĂLU, Ş.; YADAV, R.; ARMAN, A.; KORPI, A.; SOBOLA, D.; TALU, M.; REZAEE, S.; ACHOUR, A.; JUREČKA, S.; MARDANI, M.

Rok RIV

2019

Vydáno

13.02.2019

Nakladatel

WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

ISSN

1522-2454

Periodikum

Vakuum in Forschung und Praxis

Svazek

1

Číslo

30

Stát

Spolková republika Německo

Strany od

30

Strany do

35

Strany počet

6

URL

https://onlinelibrary.wiley.com/doi/full/10.1002/vipr.201900703

BibTex

@article{BUT155607,
  author="Ştefan {Ţălu} and Ram Pratap {Yadav} and Ali {Arman} and Alireza Grayeli {Korpi} and Dinara {Sobola} and Mihai {Talu} and Sahare {Rezaee} and Amine {Achour} and Stanislav {Jurečka} and Mohsen {Mardani}",
  title="Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion",
  journal="Vakuum in Forschung und Praxis",
  year="2019",
  volume="1",
  number="30",
  pages="30--35",
  doi="10.1002/vipr.201900703",
  issn="0947-076X",
  url="https://onlinelibrary.wiley.com/doi/full/10.1002/vipr.201900703"
}