Detail publikačního výsledku

SPM methods for nanotechnology

Jaroslav Kala

Originální název

SPM methods for nanotechnology

Anglický název

SPM methods for nanotechnology

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are also presented

Anglický abstrakt

The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are also presented

Klíčová slova

SPM, STM, SNOM, nanotechnology

Klíčová slova v angličtině

SPM, STM, SNOM, nanotechnology

Autoři

Jaroslav Kala

Vydáno

14.08.2005

Nakladatel

University of Miskolc, Hungary

ISBN

9636616735

Kniha

5th INTERNATIONAL CONFERENCE OF PHD STUDENTS

Edice

1

Svazek

1

Strany od

79

Strany počet

6

BibTex

@inproceedings{BUT14972,
  author="Jaroslav {Kala}",
  title="SPM methods for nanotechnology",
  booktitle="5th INTERNATIONAL CONFERENCE OF PHD STUDENTS",
  year="2005",
  series="1",
  volume="1",
  number="1",
  pages="6",
  publisher="University of Miskolc, Hungary",
  isbn="9636616735"
}