Detail publikačního výsledku

Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001)

REDONDO, J.; TELYCHKO, M.; PROCHÁZKA, P.; KONEČNÝ, M.; BERGER, J.; VONDRÁČEK, M.; ČECHAL, J.; JELÍNEK, P.; ŠVEC, M.

Originální název

Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001)

Anglický název

Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001)

Druh

Článek WoS

Originální abstrakt

The thermal decomposition of SiC wafers has proven to be a reliable method to obtain epitaxial graphene. However, the sublimation of Si induced by annealing of SiC substrates is notoriously difficult to control. To tackle the problem, the authors developed a fairly simple apparatus for the growth of micrometer-scale homogeneous single- and bilayer graphene in Ar atmosphere. The device is a furnace based on a considerably improved version of a directly heated element, and can achieve the desired sample quality reproducibly and efficiently. The authors characterize the samples prepared using this device by atomic force microscopy, low energy electron diffraction, Raman spectroscopy, scanning tunneling microscopy, x-ray photoemission spectroscopy, and nearedge x-ray absorption spectroscopy.

Anglický abstrakt

The thermal decomposition of SiC wafers has proven to be a reliable method to obtain epitaxial graphene. However, the sublimation of Si induced by annealing of SiC substrates is notoriously difficult to control. To tackle the problem, the authors developed a fairly simple apparatus for the growth of micrometer-scale homogeneous single- and bilayer graphene in Ar atmosphere. The device is a furnace based on a considerably improved version of a directly heated element, and can achieve the desired sample quality reproducibly and efficiently. The authors characterize the samples prepared using this device by atomic force microscopy, low energy electron diffraction, Raman spectroscopy, scanning tunneling microscopy, x-ray photoemission spectroscopy, and nearedge x-ray absorption spectroscopy.

Klíčová slova

CHEMICAL-VAPOR-DEPOSITION; MONOLAYER GRAPHENE; GRAIN-BOUNDARIES; SILICON-CARBIDE; SIC POLYTYPES; LARGE-AREA; FILMS; TEMPERATURE; GRAPHITE; SURFACE

Klíčová slova v angličtině

CHEMICAL-VAPOR-DEPOSITION; MONOLAYER GRAPHENE; GRAIN-BOUNDARIES; SILICON-CARBIDE; SIC POLYTYPES; LARGE-AREA; FILMS; TEMPERATURE; GRAPHITE; SURFACE

Autoři

REDONDO, J.; TELYCHKO, M.; PROCHÁZKA, P.; KONEČNÝ, M.; BERGER, J.; VONDRÁČEK, M.; ČECHAL, J.; JELÍNEK, P.; ŠVEC, M.

Rok RIV

2019

Vydáno

01.05.2018

ISSN

1520-8559

Periodikum

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Svazek

36

Číslo

3

Stát

Spojené státy americké

Strany od

031401-1

Strany do

031401-6

Strany počet

6

URL