Detail publikačního výsledku

Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S.

Originální název

Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

Anglický název

Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

Druh

Článek WoS

Originální abstrakt

The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.

Anglický abstrakt

The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.

Klíčová slova

Solar cells, topography, microscopy, fractal analysis, atomic force microscopy, surface roughness

Klíčová slova v angličtině

Solar cells, topography, microscopy, fractal analysis, atomic force microscopy, surface roughness

Autoři

ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S.

Rok RIV

2018

Vydáno

03.07.2017

Nakladatel

Springer

ISSN

0957-4522

Periodikum

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

Svazek

28

Číslo

15

Stát

Nizozemsko

Strany od

1

Strany do

12

Strany počet

12

URL

https://link.springer.com/article/10.1007/s10854-017-7422-4

BibTex

@article{BUT137752,
  author="Ştefan {Ţălu} and Nikola {Papež} and Dinara {Sobola} and Amine {Achour} and Shahram {Solaymani}",
  title="Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters",
  journal="JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS",
  year="2017",
  volume="28",
  number="15",
  pages="1--12",
  doi="10.1007/s10854-017-7422-4",
  issn="0957-4522",
  url="https://link.springer.com/article/10.1007/s10854-017-7422-4"
}