Detail publikačního výsledku

Possibilities of Secondary Electrons Detection in ESEM

SKŘIVÁNEK, J.

Originální název

Possibilities of Secondary Electrons Detection in ESEM

Anglický název

Possibilities of Secondary Electrons Detection in ESEM

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The construction of high quality, artefact – free secondary electron images in the elevated pressure conditions of an environmental scanning electron microscope (ESEM) is nontrivial process. This paper deals with possibilities of secondary electron detection by ionization and scintillation detector. It is shown a new way of using scintillation detector in environmental conditions. At the end of the article we discussed the advantages and disadvantages of these methods

Anglický abstrakt

The construction of high quality, artefact – free secondary electron images in the elevated pressure conditions of an environmental scanning electron microscope (ESEM) is nontrivial process. This paper deals with possibilities of secondary electron detection by ionization and scintillation detector. It is shown a new way of using scintillation detector in environmental conditions. At the end of the article we discussed the advantages and disadvantages of these methods

Klíčová slova

Detection, Environmental SEM,

Klíčová slova v angličtině

Detection, Environmental SEM,

Autoři

SKŘIVÁNEK, J.

Vydáno

01.01.2003

Nakladatel

Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno

Místo

Brno

ISBN

80-214-2379-X

Kniha

Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3

Strany od

529

Strany počet

5

BibTex

@inproceedings{BUT10751,
  author="Jaroslav {Skřivánek}",
  title="Possibilities of Secondary Electrons Detection in ESEM",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-2379-X"
}