Detail publikace

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

IBRAHIM, A., CHOBOLA, Z.

Originální název

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Anglický název

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Jazyk

en

Originální abstrakt

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Anglický abstrakt

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Dokumenty

BibTex 


@inproceedings{BUT10619,
  author="Ali {Ibrahim} and Zdeněk {Chobola}",
  title="Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells",
  annote="Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells",
  address="University of Tochnology",
  booktitle="Proceedings of 15th World Conference on Non-Destructive Testing",
  chapter="10619",
  institution="University of Tochnology",
  year="2000",
  month="october",
  pages="231",
  publisher="University of Tochnology",
  type="conference paper"
}