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Detail publikačního výsledku
MWEMA, F.; JEN, T.; KASPAR, P.
Originální název
Fractal Theory in Thin Films: Literature Review and Bibliometric Evidence on Applications and Trends
Anglický název
Druh
Článek WoS
Originální abstrakt
A bibliometric analysis of publications on fractal theory and thin films is presented in this article. Bibliographic information is extracted from the Web of Science digital database and the bibliographic mapping undertaken using VOSviewer software. Based on the analysis, there is a growing trend in research on the applications of fractal theory in thin film technology. The factors driving this trend are discussed in the article. The co-citation, co-authorship and bibliographic coupling among authors, institutions and regions are presented. The applications of fractal theory in thin film technology are clarified based on the bibliometric study and the directions for future research provided.
Anglický abstrakt
Klíčová slova
thin films; thin film deposition; bibliometric analysis; VOSviewer; fractals; fractal theory
Klíčová slova v angličtině
Autoři
Rok RIV
2023
Vydáno
01.09.2022
Nakladatel
MDPI
Místo
BASEL
ISSN
2504-3110
Periodikum
Fractal and Fractional
Svazek
6
Číslo
9
Stát
Švýcarská konfederace
Strany od
489
Strany počet
24
URL
https://www.mdpi.com/2504-3110/6/9/489
BibTex
@article{BUT179485, author="Fredrick M. {Mwema} and Tien-Chien {Jen} and Pavel {Kaspar}", title="Fractal Theory in Thin Films: Literature Review and Bibliometric Evidence on Applications and Trends", journal="Fractal and Fractional", year="2022", volume="6", number="9", pages="24", doi="10.3390/fractalfract6090489", url="https://www.mdpi.com/2504-3110/6/9/489" }