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MWEMA, F.; JEN, T.; KASPAR, P.
Original Title
Fractal Theory in Thin Films: Literature Review and Bibliometric Evidence on Applications and Trends
English Title
Type
WoS Article
Original Abstract
A bibliometric analysis of publications on fractal theory and thin films is presented in this article. Bibliographic information is extracted from the Web of Science digital database and the bibliographic mapping undertaken using VOSviewer software. Based on the analysis, there is a growing trend in research on the applications of fractal theory in thin film technology. The factors driving this trend are discussed in the article. The co-citation, co-authorship and bibliographic coupling among authors, institutions and regions are presented. The applications of fractal theory in thin film technology are clarified based on the bibliometric study and the directions for future research provided.
English abstract
Keywords
thin films; thin film deposition; bibliometric analysis; VOSviewer; fractals; fractal theory
Key words in English
Authors
RIV year
2023
Released
01.09.2022
Publisher
MDPI
Location
BASEL
ISBN
2504-3110
Periodical
Fractal and Fractional
Volume
6
Number
9
State
Swiss Confederation
Pages from
489
Pages count
24
URL
https://www.mdpi.com/2504-3110/6/9/489
BibTex
@article{BUT179485, author="Fredrick M. {Mwema} and Tien-Chien {Jen} and Pavel {Kaspar}", title="Fractal Theory in Thin Films: Literature Review and Bibliometric Evidence on Applications and Trends", journal="Fractal and Fractional", year="2022", volume="6", number="9", pages="24", doi="10.3390/fractalfract6090489", url="https://www.mdpi.com/2504-3110/6/9/489" }