Detail publikačního výsledku

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V.

Originální název

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Anglický název

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Druh

Konferenční sborník (ne stať)

Originální abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Anglický abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Klíčová slova

electronic circuit, design, test, design method, digital circuit, analog circuit

Klíčová slova v angličtině

electronic circuit, design, test, design method, digital circuit, analog circuit

Autoři

SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V.

Rok RIV

2022

Vydáno

12.04.2021

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

USA

ISBN

978-1-6654-3595-6

Strany počet

158

BibTex

@proceedings{BUT171158,
  editor="SHAFIQUE, M. and STEININGER, A. and SEKANINA, L. and KRSTIĆ, M. and STOJANOVIC, G. and MRÁZEK, V.",
  title="24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2021",
  pages="158",
  publisher="Institute of Electrical and Electronics Engineers",
  address="USA",
  doi="10.1109/DDECS52668.2021.9417019",
  isbn="978-1-6654-3595-6"
}