Publication result detail

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V.

Original Title

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

English Title

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Type

Conference proceedings

Original Abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

English abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Key words in English

electronic circuit, design, test, design method, digital circuit, analog circuit

Authors

SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V.

RIV year

2022

Released

12.04.2021

Publisher

Institute of Electrical and Electronics Engineers

Location

USA

ISBN

978-1-6654-3595-6

Pages count

158

BibTex

@proceedings{BUT171158,
  editor="SHAFIQUE, M. and STEININGER, A. and SEKANINA, L. and KRSTIĆ, M. and STOJANOVIC, G. and MRÁZEK, V.",
  title="24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2021",
  pages="158",
  publisher="Institute of Electrical and Electronics Engineers",
  address="USA",
  doi="10.1109/DDECS52668.2021.9417019",
  isbn="978-1-6654-3595-6"
}