Publication result detail

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P.

Original Title

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

English Title

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

Type

Paper in proceedings (conference paper)

Original Abstract

This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.

English abstract

This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.

Keywords

ebic; structural analysis; solar cells; defects

Key words in English

ebic; structural analysis; solar cells; defects

Authors

PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P.

RIV year

2021

Released

19.02.2020

Publisher

Elsevier

Book

Procedia Structural Integrity

ISBN

2452-3216

Periodical

Procedia Structural Integrity

Volume

23

Number

1

State

Republic of Italy

Pages from

595

Pages to

600

Pages count

6

URL

https://www.sciencedirect.com/science/article/pii/S2452321620302183

Full text in the Digital Library

http://hdl.handle.net/11012/193483

BibTex

@inproceedings{BUT161694,
  author="Nikola {Papež} and Rashid {Dallaev} and Dinara {Sobola} and Robert {Macků} and Pavel {Škarvada}",
  title="Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method",
  booktitle="Procedia Structural Integrity",
  year="2020",
  journal="Procedia Structural Integrity",
  volume="23",
  number="1",
  pages="595--600",
  publisher="Elsevier",
  doi="10.1016/j.prostr.2020.01.151",
  issn="2452-3216",
  url="https://www.sciencedirect.com/science/article/pii/S2452321620302183"
}

Documents

1-s2.0-S2452321620302183-main