Detail publikačního výsledku

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L.

Original Title

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

English Title

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

Type

WoS Article

Original Abstract

Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.

English abstract

Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.

Keywords

Graphite Fe2O3 Ellipsometry XPS AFM

Key words in English

Graphite Fe2O3 Ellipsometry XPS AFM

Authors

KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L.

RIV year

2020

Released

01.11.2019

Publisher

Elsevier

ISBN

0169-4332

Periodical

APPLIED SURFACE SCIENCE

Volume

493

Number

1

State

Kingdom of the Netherlands

Pages from

673

Pages to

678

Pages count

6

URL

https://www.sciencedirect.com/science/article/pii/S016943321932094X

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT157664,
  author="Pavel {Kaspar} and Dinara {Sobola} and Rashid {Dallaev} and Shihgasan {Ramazanov} and Alois {Nebojsa} and Sahare {Rezaee} and Lubomír {Grmela}",
  title="Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS",
  journal="APPLIED SURFACE SCIENCE",
  year="2019",
  volume="493",
  number="1",
  pages="673--678",
  doi="10.1016/j.apsusc.2019.07.058",
  issn="0169-4332",
  url="https://www.sciencedirect.com/science/article/pii/S016943321932094X"
}

Documents

157664_Characterization