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Detail publikačního výsledku
FIALA, P.; GESCHEIDTOVÁ, E.; STEINBAUER, M.
Originální název
Ultra-short solitary electromagnetic pulses measurement and semiconductor testing
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp = <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.
Anglický abstrakt
Klíčová slova
Measurement, weapons, electromagnetic puls, high power microwave source, calorimetric method, electro-optic method
Klíčová slova v angličtině
Autoři
Vydáno
26.05.2004
Místo
Polsko
ISBN
83-85940-26-X
Kniha
IC-SPETO 2004
Edice
Vol.1
Strany od
159
Strany počet
162
BibTex
@inproceedings{BUT14251, author="Pavel {Fiala} and Eva {Gescheidtová} and Miloslav {Steinbauer}", title="Ultra-short solitary electromagnetic pulses measurement and semiconductor testing", booktitle="IC-SPETO 2004", year="2004", series="Vol.1", number="první", pages="162", address="Polsko", isbn="83-85940-26-X" }