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FIALA, P.; GESCHEIDTOVÁ, E.; STEINBAUER, M.
Original Title
Ultra-short solitary electromagnetic pulses measurement and semiconductor testing
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp = <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.
English abstract
Keywords
Measurement, weapons, electromagnetic puls, high power microwave source, calorimetric method, electro-optic method
Key words in English
Authors
Released
26.05.2004
Location
Polsko
ISBN
83-85940-26-X
Book
IC-SPETO 2004
Edition
Vol.1
Pages from
159
Pages count
162
BibTex
@inproceedings{BUT14251, author="Pavel {Fiala} and Eva {Gescheidtová} and Miloslav {Steinbauer}", title="Ultra-short solitary electromagnetic pulses measurement and semiconductor testing", booktitle="IC-SPETO 2004", year="2004", series="Vol.1", number="první", pages="162", address="Polsko", isbn="83-85940-26-X" }