Detail publikace

Study of Microplasma Noise Statistical Characteristics for GaAsP Diodes

KOKTAVÝ, P.

Originální název

Study of Microplasma Noise Statistical Characteristics for GaAsP Diodes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Characteristics of an impulse random process which arises in consequence of the bi-stable nature of the microplasma conductivity in GaAsP light emitting diode p-n junctions are dealt with in the present paper. Experiments show that the microplasma bi-stable behaviour may be described as a two-state stochastic process of a generation-recombination type (G-R process), which is Markovian, provided that the diode is operated in low-impedance load conditions. Theoretical solution of the model has been carried out, from which statistical characteristics of the process have subsequently been derived. Based on the theoretical analysis results, a methodology to be applied to the above-mentioned characteristic evaluation has been worked out. Experimental study of these characteristics has followed. The theoretical analysis shows that the process characteristics depend on the g and r parameters. The quantities g and r are the respective generation and recombination coefficients (turn-on probability p01 and turn-off probability p10), both depending on the applied voltage and temperature for stationary random processes. Our experiments are confirming a very close agreement between the theoretically derived and experimental characteristics.

Klíčová slova

Microplasma noise, Generation-recombination process, PN junction, Avalanche

Autoři

KOKTAVÝ, P.

Rok RIV

2003

Vydáno

18. 8. 2003

Nakladatel

CNRL, s.r.o.

Místo

Prague

ISBN

80-239-1055-1

Kniha

Proceedings of the 17th International Conference Noise and Fluctuation ICNF 2003

Strany od

437

Strany do

440

Strany počet

4

BibTex

@inproceedings{BUT9240,
  author="Pavel {Koktavý}",
  title="Study of Microplasma Noise Statistical Characteristics for GaAsP Diodes",
  booktitle="Proceedings of the 17th International Conference Noise and Fluctuation ICNF 2003",
  year="2003",
  pages="4",
  publisher="CNRL, s.r.o.",
  address="Prague",
  isbn="80-239-1055-1"
}