Detail publikace

Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films

FRANTA, D. NEČAS, D. OHLÍDAL, I. HRDLIČKA, M. PAVLIŠTA, M. FRUMAR, M. OHLÍDAL, M.

Originální název

Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The optical characterisation of the As33Se67 and Ge2Sb2Te5 chalcogenide thin films is carried out using the combined method of VASE and SR. This method permits to determine both structural and dispersion parameters describing the thin films exhibiting various defects. The structural model is based on including roughness, overlayers and thickness non-uniformity. The dispersion models are based on parametrisation of the joint density of states. These models, unlike the classical models derived from the Lorentz oscillator model, can describe finite bands which allows to introduce a parameter proportional to the density of electrons. It is shown that this method enables to investigate quantitatively changes in the electronic structure of the materials caused by phase transitions which is demonstrated on the Ge2Sb2Te5. It is shown that the combined method with including true structural and dispersion models is a powerful tool for the optical characterisation of thin films exhibiting disordered structure.

Klíčová slova

Ellipsometry; Photometry; Chalcogenige; Thin film

Autoři

FRANTA, D.; NEČAS, D.; OHLÍDAL, I.; HRDLIČKA, M.; PAVLIŠTA, M.; FRUMAR, M.; OHLÍDAL, M.

Rok RIV

2009

Vydáno

25. 12. 2009

Nakladatel

NATL INST OPTOELECTRONICS

Místo

BUCHAREST-MAGURELE 76900, ROMANIA

ISSN

1454-4164

Periodikum

Journal of Optoelectronics and Advanced Materials

Ročník

11

Číslo

12

Stát

Rumunsko

Strany od

1891

Strany do

1898

Strany počet

8

BibTex

@article{BUT49384,
  author="Daniel {Franta} and David {Nečas} and Ivan {Ohlídal} and Martin {Hrdlička} and Martin {Pavlišta} and Miloslav {Frumar} and Miloslav {Ohlídal}",
  title="Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films",
  journal="Journal of Optoelectronics and Advanced Materials",
  year="2009",
  volume="11",
  number="12",
  pages="1891--1898",
  issn="1454-4164"
}