Detail publikace

Near-field scanning optical microscope probe analysis

KLAPETEK, P. BURŠÍK, J. MARTINEK, J.

Originální název

Near-field scanning optical microscope probe analysis

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.

Klíčová slova

NSOM, artifacts

Autoři

KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J.

Rok RIV

2008

Vydáno

12. 11. 2007

ISSN

0304-3991

Periodikum

Ultramicroscopy

Ročník

2007

Číslo

1

Stát

Nizozemsko

Strany od

1

Strany do

1

Strany počet

4

BibTex

@article{BUT44372,
  author="Petr {Klapetek} and Jiří {Buršík} and Jan {Martinek}",
  title="Near-field scanning optical microscope probe analysis",
  journal="Ultramicroscopy",
  year="2007",
  volume="2007",
  number="1",
  pages="1--1",
  issn="0304-3991"
}