Detail publikace

Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation

HURTA, M. SCHWARZEROVÁ, J. NAGELE, T. WECKWERTH, W. PROVAZNÍK, V. SEKANINA, L.

Originální název

Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The polygenic risk score has proven to be a valuable tool for assessing an individual's genetic predisposition to phenotype (disease) within biomedicine in recent years. However, traditional regression-based methods for polygenic risk scores calculation have limitations that can impede their accuracy and predictive power. This study introduces an innovative approach to enhance polygenic risk scores calculation through the application of genetic programming. By harnessing the power of genetic programming, we aim to overcome the limitations of traditional regression techniques and improve the accuracy of polygenic risk scores predictions. Specifically, we showed that a polygenic risk score generated through Cartesian genetic programming yielded comparable or even more robust statistical distinctions between groups that we evaluated within three independent case studies.

Klíčová slova

Polygenic risk score, genetic variations, computational biology, genetic programming

Autoři

HURTA, M.; SCHWARZEROVÁ, J.; NAGELE, T.; WECKWERTH, W.; PROVAZNÍK, V.; SEKANINA, L.

Vydáno

2. 12. 2023

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Istanbul

ISBN

979-8-3503-3748-8

Kniha

2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2023)

Strany od

3782

Strany do

3787

Strany počet

6

URL

BibTex

@inproceedings{BUT185638,
  author="Martin {Hurta} and Jana {Schwarzerová} and Thomas {Nägele} and Wolfram {Weckwerth} and Valentine {Provazník} and Lukáš {Sekanina}",
  title="Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation",
  booktitle="2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2023)",
  year="2023",
  pages="3782--3787",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Istanbul",
  doi="10.1109/BIBM58861.2023.10385615",
  isbn="979-8-3503-3748-8",
  url="https://ieeexplore.ieee.org/document/10385615"
}