Detail publikace

Compliance testing concept of grid-connected inverter-based resources using simulated input

DVOŘÁČEK, J. DRÁPELA, J. MORÁVEK, J. VOJTEK, M. TOMAN, P. RASSÕLKIN, A. VAIMANN, T.

Originální název

Compliance testing concept of grid-connected inverter-based resources using simulated input

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper aims at methods for compliance testing of power-generating modules (PGMs) or their components. The methods discussion include power-hardware-in-loop (PHIL), controller-hardware-in-loop and novel simulated input PHIL (SI-PHIL) techniques. The advantages and disadvantages of the test techniques and their feasibility for laboratory or field settings are presented. In the following, the SI-PHIL approach to verify selected PGM requirements related to static network support is demonstrated on an inverter based PGM model. Further discussion aims at the necessity to establish robust test methodology if SI-PHIL is to be extensively used and points out possible critical vulnerabilities of internet-connected PGMs.

Klíčová slova

distributed generation, compliance verification, simulation, simulated input, grid code

Autoři

DVOŘÁČEK, J.; DRÁPELA, J.; MORÁVEK, J.; VOJTEK, M.; TOMAN, P.; RASSÕLKIN, A.; VAIMANN, T.

Vydáno

24. 5. 2023

Nakladatel

IEEE

Místo

NEW YORK

ISBN

979-8-3503-3593-4

Kniha

Proceedings of the 2023 23rd International Scientific Conference on Electric Power Engineering (EPE)

Strany od

55

Strany do

60

Strany počet

6

URL

https://ieeexplore.ieee.org/document/10149232

BibTex

@inproceedings{BUT183621,
  author="Jiří {Dvořáček} and Jiří {Drápela} and Jan {Morávek} and Martin {Vojtek} and Petr {Toman} and Anton {Rassõlkin} and Toomas {Vaimann}",
  title="Compliance testing concept of grid-connected inverter-based resources using simulated input",
  booktitle="Proceedings of the 2023 23rd International Scientific Conference on Electric Power Engineering (EPE)",
  year="2023",
  pages="55--60",
  publisher="IEEE",
  address="NEW YORK",
  doi="10.1109/EPE58302.2023.10149232",
  isbn="979-8-3503-3593-4",
  url="https://ieeexplore.ieee.org/document/10149232"
}