Detail publikace

Practical Aspects of Impedance Measurement using Operational Amplifier and Oscilloscope

SVOBODA, M. ŠOTNER, R. POLÁK, L.

Originální název

Practical Aspects of Impedance Measurement using Operational Amplifier and Oscilloscope

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with a readout-based low-frequency impedance measurement employing an operational amplifier and a special oscilloscope with frequency response analysis option for automatic measurement of Bode plots. The presented method is known from a point-to-point measurement using standard oscilloscopes and an external generator, but the main real limiting factors are not often evaluated and discussed. Limitations of the method, the real key features of the measurement setup and their impact on the validity of results are discussed in this work. The proposed concept represents a low-cost way of impedance measurement for fast and educational purposes. Measurement results were confirmed by theoretical and simulation ones. Their accuracy satisfies the low-frequency measurement of impedances within indicated limits and for intended purposes.

Klíčová slova

Automatic measurement, capacitance, frequency response analysis, impedance measurement, inductance, operational amplifier, oscilloscope

Autoři

SVOBODA, M.; ŠOTNER, R.; POLÁK, L.

Vydáno

21. 4. 2022

Místo

Košice, Slovakia

ISBN

978-1-7281-8686-3

Kniha

32nd International Conference Radioelektronika

Strany od

86

Strany do

89

Strany počet

4

URL

https://ieeexplore.ieee.org/abstract/document/9764942

BibTex

@inproceedings{BUT178299,
  author="Marek {Svoboda} and Roman {Šotner} and Ladislav {Polák}",
  title="Practical Aspects of Impedance Measurement using Operational Amplifier and Oscilloscope",
  booktitle="32nd International Conference Radioelektronika",
  year="2022",
  pages="86--89",
  address="Košice, Slovakia",
  doi="10.1109/RADIOELEKTRONIKA54537.2022.9764942",
  isbn="978-1-7281-8686-3",
  url="https://ieeexplore.ieee.org/abstract/document/9764942"
}