Detail publikace

Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots

ALLAHAM, M. BURDA, D. MOUSA, M. KNÁPEK, A. AlJrawen S.Y. AlSa’eed M. H.

Originální název

Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Field electron emission theory and experiments include testing and analyzing the measured current-voltage characteristics using the so-called Fowler-Nordheim or Murphy-Good plots. Although Fowler-Nordheim plots are theoretically predicted to be slightly curved and Murphy-Good plots are predicted to be almost-exactly straight, still they provide the same results when applying the field-emission orthodoxy test to practical experimental data, and near results when extracting the emitter characterization parameters. This study is to compare the analysis results that will be obtained when applying the two methods to experimental data obtained from Molybdenum single field emitters, mounted in a traditional field emission microscope, and operated in high vacuum conditions (~10 -6 Pa).

Klíčová slova

Geometry; Shape; Surface contamination; Ions; Iron; Electron emission; Molybdenum

Autoři

ALLAHAM, M.; BURDA, D.; MOUSA, M.; KNÁPEK, A.; AlJrawen S.Y.; AlSa’eed M. H.

Vydáno

17. 11. 2021

Nakladatel

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

Místo

Lyon, France

ISBN

978-1-6654-2589-6

Kniha

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

ISSN

2380-6311

Periodikum

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

Stát

Spojené státy americké

Strany od

151

Strany do

152

Strany počet

2

URL

BibTex

@inproceedings{BUT175014,
  author="Mohammad Mahmoud {Allaham} and Marwan {Mousa} and Daniel {Burda} and Mohammad H. {AlSa'eed} and Sabreen Y. {AlJrawen} and Alexandr {Knápek}",
  title="Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots",
  booktitle="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  year="2021",
  journal="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  pages="151--152",
  publisher="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  address="Lyon, France",
  doi="10.1109/IVNC52431.2021.9600771",
  isbn="978-1-6654-2589-6",
  issn="2380-6311",
  url="https://ieeexplore.ieee.org/document/9600771"
}