Detail publikace

Synthetic Data in Quantitative Scanning Probe Microscopy

NEČAS, D. KLAPETEK, P.

Originální název

Synthetic Data in Quantitative Scanning Probe Microscopy

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

Klíčová slova

nanometrology; data synthesis; scanning probe microscopy

Autoři

NEČAS, D.; KLAPETEK, P.

Vydáno

1. 6. 2021

Nakladatel

MDPI

Místo

BASEL

ISSN

2079-4991

Periodikum

Nanomaterials

Ročník

11

Číslo

7

Stát

Švýcarská konfederace

Strany od

1

Strany do

26

Strany počet

26

URL

https://www.mdpi.com/2079-4991/11/7/1746

Plný text v Digitální knihovně

http://hdl.handle.net/11012/203015

BibTex

@article{BUT173174,
  author="David {Nečas} and Petr {Klapetek}",
  title="Synthetic Data in Quantitative Scanning Probe Microscopy",
  journal="Nanomaterials",
  year="2021",
  volume="11",
  number="7",
  pages="1--26",
  doi="10.3390/nano11071746",
  issn="2079-4991",
  url="https://www.mdpi.com/2079-4991/11/7/1746"
}