Detail publikačního výsledku

AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.

LOPOUR, F., ŠIKOLA, T., ŠKODA, D.

Originální název

AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.

Anglický název

AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Atomic force microscopy (AFM) has become a powerful tool for studies of topography of solids and micro/nanostructures. In the contribution the design principles and applications of an AFM microscope developed at the institute will be presented. Particularly, the results of experiments carried out on thin films, micro- and nanostructures will be discussed. Additionally, nanostructures fabricated by AFM will be shown as well.

Anglický abstrakt

Atomic force microscopy (AFM) has become a powerful tool for studies of topography of solids and micro/nanostructures. In the contribution the design principles and applications of an AFM microscope developed at the institute will be presented. Particularly, the results of experiments carried out on thin films, micro- and nanostructures will be discussed. Additionally, nanostructures fabricated by AFM will be shown as well.

Klíčová slova v angličtině

AFM

Autoři

LOPOUR, F., ŠIKOLA, T., ŠKODA, D.

Rok RIV

2011

Vydáno

27.06.2001

Nakladatel

Vutium

Místo

Brno

ISBN

80-214-1892-3

Kniha

Materials Structure & Micromechanics of Fracture (MSMF-3)

Strany od

394

Strany počet

6

BibTex

@inproceedings{BUT6291,
  author="Filip {Lopour} and Tomáš {Šikola} and David {Škoda}",
  title="AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.",
  booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
  year="2001",
  pages="6",
  publisher="Vutium",
  address="Brno",
  isbn="80-214-1892-3"
}