Detail publikačního výsledku

Analysis of back side contact imaging phenomenon in LBIC

VESELÝ, A.

Originální název

Analysis of back side contact imaging phenomenon in LBIC

Anglický název

Analysis of back side contact imaging phenomenon in LBIC

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper deals with analysis of back side imagining of solar cells phenomenon. By usage of light radiation generated by UV LED with average wave length 400 nm photons penetrate to the depth about 0.1 m, which is an area before PN junction tested photovoltaic cell. The generated pairs of electron-hole are affected by various recombinations mostly by the surface recombination. On the figure is shown back side grid (Fig. 1) taken by the UV LED LBIC.

Anglický abstrakt

This paper deals with analysis of back side imagining of solar cells phenomenon. By usage of light radiation generated by UV LED with average wave length 400 nm photons penetrate to the depth about 0.1 m, which is an area before PN junction tested photovoltaic cell. The generated pairs of electron-hole are affected by various recombinations mostly by the surface recombination. On the figure is shown back side grid (Fig. 1) taken by the UV LED LBIC.

Klíčová slova

back side contact, imaging, solar cell, LBIC

Klíčová slova v angličtině

back side contact, imaging, solar cell, LBIC

Autoři

VESELÝ, A.

Rok RIV

2010

Vydáno

23.04.2009

Nakladatel

NOVPRESS s.r.o.

Místo

Brno

ISBN

978-80-214-3870-5

Kniha

Proceedings of the 15.th conference Student EEICT, volume 3

Strany od

223

Strany do

226

Strany počet

4

BibTex

@inproceedings{BUT30267,
  author="Aleš {Veselý}",
  title="Analysis of back side contact imaging phenomenon in LBIC",
  booktitle="Proceedings of the 15.th conference Student EEICT, volume 3",
  year="2009",
  number="1",
  pages="223--226",
  publisher="NOVPRESS s.r.o.",
  address="Brno",
  isbn="978-80-214-3870-5"
}