Detail publikace

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

KROLÁK, D. HORSKÝ, P.

Originální název

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

Klíčová slova

Bandgap voltage reference, Brokaw, BCD, EMC, HF immunity, Kuijk, offset, temperature drift, Tsividis

Autoři

KROLÁK, D.; HORSKÝ, P.

Vydáno

16. 8. 2022

Nakladatel

Radioengineering

Místo

Praha, CZ

ISSN

1210-2512

Periodikum

Radioengineering

Ročník

31

Číslo

3

Stát

Česká republika

Strany od

413

Strany do

421

Strany počet

9

URL

https://www.radioeng.cz/fulltexts/2022/22_03_0413_0421.pdf

BibTex

@article{BUT172476,
  author="David {Krolák} and Pavel {Horský}",
  title="An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores",
  journal="Radioengineering",
  year="2022",
  volume="31",
  number="3",
  pages="413--421",
  doi="10.13164/RE.2022.0413",
  issn="1210-2512",
  url="https://www.radioeng.cz/fulltexts/2022/22_03_0413_0421.pdf"
}