Detail publikačního výsledku

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

STAMENKOVIC, Z.; BOSIO, A.; CSEREY, G.; NOVÁK, O.; PLESKACZ, W.; SEKANINA, L.; STEININGER, A.; STOJANOVIC, G.; STOPJAKOVÁ, V.

Originální název

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Anglický název

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper is a contribution to the 50th anniversary celebration of the International Test Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years. It covers the past, present, and future of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test technology related events initiated and supported by the ITC.

Anglický abstrakt

The paper is a contribution to the 50th anniversary celebration of the International Test Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years. It covers the past, present, and future of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test technology related events initiated and supported by the ITC.

Klíčová slova

symposium, DDECS, electronics, circuits, systems

Klíčová slova v angličtině

symposium, DDECS, electronics, circuits, systems

Autoři

STAMENKOVIC, Z.; BOSIO, A.; CSEREY, G.; NOVÁK, O.; PLESKACZ, W.; SEKANINA, L.; STEININGER, A.; STOJANOVIC, G.; STOPJAKOVÁ, V.

Rok RIV

2020

Vydáno

09.11.2019

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Washington, DC

ISBN

978-1-7281-4823-6

Kniha

2019 IEEE International Test Conference

Strany od

1

Strany do

4

Strany počet

4

URL

https://www.fit.vut.cz/research/publication/12200/

BibTex

@inproceedings{BUT162595,
  author="STAMENKOVIC, Z. and BOSIO, A. and CSEREY, G. and NOVÁK, O. and PLESKACZ, W. and SEKANINA, L. and STEININGER, A. and STOJANOVIC, G. and STOPJAKOVÁ, V.",
  title="International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  booktitle="2019 IEEE International Test Conference",
  year="2019",
  pages="1--4",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Washington, DC",
  doi="10.1109/ITC44170.2019.9000137",
  isbn="978-1-7281-4823-6",
  url="https://www.fit.vut.cz/research/publication/12200/"
}

Dokumenty

itc19ddecs_web